English: G. Kaupp. Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces. Heidelberg: Springer, 2006.
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2007-10-16 16:27 Sgptch 1152×503× (16949 bytes) G. Kaupp. Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces. Heidelberg: Springer, 2006.
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